Optical characterization of doped SIMOX structures using FTIR spectroscopy
C.C. Katsidis, D.I. Siapkas, D. Panknin, N. Hatzopoulos, W. SkorupaVolume:
28
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(95)00092-m
File:
PDF, 303 KB
english, 1995