Absolute measurement of transient carrier concentration and temperature gradients in power semiconductor devices by internal IR-laser deflection
G. Deboy, G. Sölkner, E. Wolfgang, W. ClaeysVolume:
31
Year:
1996
Language:
english
Pages:
9
DOI:
10.1016/0167-9317(95)00352-5
File:
PDF, 503 KB
english, 1996