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Conference on Patterns and Processes in the Plane
D. J. Bartholomew, R. J. Bennett, Julian Besag, Don McNeil, Andrew D. Cliff, Keith Ord, Pierre Delfiner, Peter J. Diggle, R. F. Galbraith, D. Walley, S. Gregory, R. P. Haining, R. J. Johnston, R. MeadVolume:
8
Language:
english
Journal:
Advances in Applied Probability
DOI:
10.2307/1425928
Date:
December, 1976
File:
PDF, 677 KB
english, 1976