In situ microanalysis for 34S/32S ratios using the ion microprobe SHRIMP
C.S. Eldrige, W. Compston, I.S. Williams, J.L. Walshe, R.A. BothVolume:
76
Year:
1987
Language:
english
Pages:
19
DOI:
10.1016/0168-1176(87)85011-5
File:
PDF, 1.14 MB
english, 1987