Measurement and visual observation of sample charging...

Measurement and visual observation of sample charging effects on primary beam focusing in secondary ion mass spectrometry

Anthony D. Appelhans
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Volume:
88
Year:
1989
Language:
english
Pages:
13
DOI:
10.1016/0168-1176(89)85014-1
File:
PDF, 857 KB
english, 1989
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