Reflectron time-of-flight mass spectrometry and laser excitation for the analysis of neutrals, ionized molecules and secondary fragments
U. Boesl, R. Weinkauf, E.W. SchlagVolume:
112
Year:
1992
Language:
english
Pages:
46
DOI:
10.1016/0168-1176(92)80001-h
File:
PDF, 2.78 MB
english, 1992