Analysis of microdefects in a silicon single crystal by...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1986 Vol. 246; Iss. 1-3

Analysis of microdefects in a silicon single crystal by diffuse X-ray scattering using synchrotron radiation

Hante Kim, Shun Ji Gotoh, Toshio Takahashi, Tetsuya Ishikawa, Seishi Kikuta
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
246
Year:
1986
Language:
english
Pages:
4
DOI:
10.1016/0168-9002(86)90199-3
File:
PDF, 218 KB
english, 1986
Conversion to is in progress
Conversion to is failed