Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
1987 Vol. 261; Iss. 1-2
The structure of nickel and indium oxide thin films from EXAFS data
V. Bets, T. Zamozdiks, A. Lusis, J. Purans, N. Bausk, M. SheromovVolume:
261
Year:
1987
Language:
english
Pages:
2
DOI:
10.1016/0168-9002(87)90592-4
File:
PDF, 122 KB
english, 1987