Test of annealed Czochralski grown silicon crystals as...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1989 Vol. 276; Iss. 3

Test of annealed Czochralski grown silicon crystals as X-ray diffraction elements with 145 keV synchrotron radiation

J.R. Schneider, H. Nagasawa, L.E. Berman, J.B. Hastings, D.P. Siddons, W. Zulehner
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Volume:
276
Year:
1989
Language:
english
Pages:
7
DOI:
10.1016/0168-9002(89)90597-4
File:
PDF, 510 KB
english, 1989
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