Evaluation of passivated ion implanted planar silicon...

Evaluation of passivated ion implanted planar silicon detectors for the spectroscopy and assay of low energy electrons

Jonathan Robert Batten
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Volume:
277
Year:
1989
Language:
english
Pages:
7
DOI:
10.1016/0168-9002(89)90778-x
File:
PDF, 514 KB
english, 1989
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