A pattern recognition approach in X-ray fluorescence...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1989 Vol. 277; Iss. 2-3

A pattern recognition approach in X-ray fluorescence analysis

Lo I Yin, Jacob I. Trombka, Stephen M. Seltzer
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Volume:
277
Year:
1989
Language:
english
Pages:
8
DOI:
10.1016/0168-9002(89)90797-3
File:
PDF, 559 KB
english, 1989
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