Leakage current, annealing, and deep defect production...

Leakage current, annealing, and deep defect production studies in neutron irradiated n-type Si-detectors

E. Borchi, R. Macii, C. Leroy, C. Manoukian-Bertrand, C. Furetta, R. Paludetto, S. Pensotti, P.G. Rancoita, M. Rattaggi, A. Seidman, L. Vismara
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Volume:
301
Year:
1991
Language:
english
Pages:
4
DOI:
10.1016/0168-9002(91)90461-x
File:
PDF, 297 KB
english, 1991
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