Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
1991 Vol. 308; Iss. 1-2
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X-ray diffractometry of thin films using synchrotron radiation beams
L.G. Shabelnikov, A.P. ZuevVolume:
308
Year:
1991
Language:
english
Pages:
3
DOI:
10.1016/0168-9002(91)90654-9
File:
PDF, 169 KB
english, 1991