Total reflection X-ray fluorescence analysis with...

Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures

R. Rieder, P. Wobrauschek, W. Ladisich, C. Streli, H. Aiginger, S. Garbe, G. Gaul, A. Knöchel, F. Lechtenberg
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
355
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/0168-9002(94)01157-5
File:
PDF, 699 KB
english, 1995
Conversion to is in progress
Conversion to is failed