Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
1995 Vol. 355; Iss. 2-3
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Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures
R. Rieder, P. Wobrauschek, W. Ladisich, C. Streli, H. Aiginger, S. Garbe, G. Gaul, A. Knöchel, F. LechtenbergVolume:
355
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/0168-9002(94)01157-5
File:
PDF, 699 KB
english, 1995