Porous silicon: X-rays sensitivity

Porous silicon: X-rays sensitivity

Jean-Louis Gerstenmayer, Patrick Vibert, Patrick Mercier, Claude Rayer, Michel Hyvernage, Roland Herino, Ahmad Bsiesy
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Volume:
353
Year:
1994
Language:
english
Pages:
3
DOI:
10.1016/0168-9002(94)91661-6
File:
PDF, 282 KB
english, 1994
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