Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
1994 Vol. 353; Iss. 1-3
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A pattern-deviation photon scanning technique for precise measurement of internal component locations
William L. Dunn, Michael H. van Haaren, Abdelfatah M. YacoutVolume:
353
Year:
1994
Language:
english
Pages:
5
DOI:
10.1016/0168-9002(94)91745-0
File:
PDF, 310 KB
english, 1994