First beam tests of a Fast-RICH prototype with VLSI readout...

First beam tests of a Fast-RICH prototype with VLSI readout electronics

R.J Mountain, J Séguinot, T Ypsilantis, J.P Jobez, R Arnold, J.L Guyonnet, E Chesi, J Tischhauser, I Adachi, T Sumiyoshi
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Volume:
360
Year:
1995
Language:
english
Pages:
11
DOI:
10.1016/0168-9002(95)00109-3
File:
PDF, 1.14 MB
english, 1995
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