Elevated temperature annealing behaviors of bulk...

Elevated temperature annealing behaviors of bulk resistivity and space charge density (Neff) of neutron irradiated silicon detectors and materials

Z. Li
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Volume:
368
Year:
1996
Language:
english
Pages:
11
DOI:
10.1016/0168-9002(95)00801-2
File:
PDF, 878 KB
english, 1996
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