Radiation hardness of punch-through and FET biased silicon...

Radiation hardness of punch-through and FET biased silicon microstrip detectors

Trond I. Westgaard, Berit S. Avset, Niaz N. Ahmed, Lars Evensen
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Volume:
377
Year:
1996
Language:
english
Pages:
6
DOI:
10.1016/0168-9002(96)00216-1
File:
PDF, 408 KB
english, 1996
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