A novel technique to determine hetero-surface diffusion in...

Applied Surface Science 1988 Vol. 33-34; Iss. none

A novel technique to determine hetero-surface diffusion in semiconductor systems

M. Zinke-Allmang, L.C. Feldman
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Volume:
33-34
Year:
1988
Language:
english
Pages:
5
DOI:
10.1016/0169-4332(88)90331-5
File:
PDF, 229 KB
english, 1988
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