The changes in Si surface roughness and their diagnostics

The changes in Si surface roughness and their diagnostics

I.A. Aizenberg, I.R. Moskvina, S.N. Nosenko
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Volume:
39
Year:
1989
Language:
english
Pages:
6
DOI:
10.1016/0169-4332(89)90463-7
File:
PDF, 223 KB
english, 1989
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