Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and...

Applied Surface Science 1990 Vol. 45; Iss. 1

Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure: a new combination for modeling thin layers

W.A.M. Aarnink, A. Weishaupt, A. van Silfhout
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Volume:
45
Year:
1990
Language:
english
Pages:
12
DOI:
10.1016/0169-4332(90)90018-u
File:
PDF, 681 KB
english, 1990
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