Characterization of double-layer transparent films on absorbing substrates using multiple-angle ellipsometry
T. Easwarakhanthan, Z. Ouennoughi, M. Renard, J.R. CussenotVolume:
47
Year:
1991
Language:
english
Pages:
81
DOI:
10.1016/0169-4332(91)90083-v
File:
PDF, 550 KB
english, 1991