Characterization of low-temperature MOCVD Cd1−xMnxTe thin films
G.N. Pain, T. Warminski, S. Sulcs, M.S. Kwietniak, D. Gao, S.R. Glanvill, C.J. Rossouw, A.W. Stevenson, S.P. Russo, R.G. Elliman, L.S. Wielunski, R.S. Rowe, G.B. Deacon, R.S. Dickson, B.O. WestVolume:
48-49
Year:
1991
Language:
english
Pages:
13
DOI:
10.1016/0169-4332(91)90310-g
File:
PDF, 3.31 MB
english, 1991