High-energy-ion-induced damages at metal-silicon interfaces...

High-energy-ion-induced damages at metal-silicon interfaces during channeling measurements

Jong Moon, Toshimichi Ito, Akio Hiraki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
56-58
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0169-4332(92)90273-z
File:
PDF, 232 KB
english, 1992
Conversion to is in progress
Conversion to is failed