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High-energy-ion-induced damages at metal-silicon interfaces during channeling measurements
Jong Moon, Toshimichi Ito, Akio HirakiVolume:
56-58
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0169-4332(92)90273-z
File:
PDF, 232 KB
english, 1992