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Characterization and electronic properties of the Tb/Si(111)7 × 7 interface
S. Kennou, J.-Y. Veuillen, T.A. Nguyen TanVolume:
56-58
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0169-4332(92)90281-2
File:
PDF, 182 KB
english, 1992