Probing heterojunctions by ballistic electron emission microscopy
A.E. Fowell, A.A. Cafolla, B.E. Richardson, T.-H. Shen, M. Elliott, D.I. Westwood, R.H. WilliamsVolume:
56-58
Year:
1992
Language:
english
Pages:
6
DOI:
10.1016/0169-4332(92)90311-k
File:
PDF, 750 KB
english, 1992