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TEM characterization of the GaP/Si interface grown by MOCVD
T. Soga, Z.K. Jiang, T. Suzuki, T. Jimbo, M. UmenoVolume:
60-61
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0169-4332(92)90447-6
File:
PDF, 1.80 MB
english, 1992