Direct REM observation of structural processes on clean...

Applied Surface Science 1992 Vol. 60-61; Iss. none

Direct REM observation of structural processes on clean silicon surfaces during sublimation, phase transition and epitaxy

A.V. Latyshev, A.B. Krasilnikov, A.L. Aseev
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Volume:
60-61
Year:
1992
Language:
english
Pages:
8
DOI:
10.1016/0169-4332(92)90450-c
File:
PDF, 1.55 MB
english, 1992
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