X-ray diffraction study of corrugated semiconductor...

X-ray diffraction study of corrugated semiconductor surfaces, quantum wires and quantum ☐es

L. Tapfer, G.C. La Rocca, H. Lage, O. Brandt, D. Heitmann, K. Ploog
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Volume:
60-61
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0169-4332(92)90469-e
File:
PDF, 249 KB
english, 1992
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