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ArF excimer laser deposited tin oxide films studied by “in situ” surface diagnostics and by synchrotron radiation induced UV photoemission
R. Larciprete, E. Borsella, P. De Padova, M. Fanfoni, M. Mangiantini, P. PerfettiVolume:
69
Year:
1993
Language:
english
Pages:
6
DOI:
10.1016/0169-4332(93)90482-q
File:
PDF, 465 KB
english, 1993