Optical absorption and structural characterization of...

Applied Surface Science 1993 Vol. 65-66; Iss. none

Optical absorption and structural characterization of reactively sputtered tellurium suboxide thin films

M. Di Giulio, M.C. Nicotra, M. Re, R. Rella, P. Siciliano
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Volume:
65-66
Year:
1993
Language:
english
Pages:
6
DOI:
10.1016/0169-4332(93)90678-5
File:
PDF, 640 KB
english, 1993
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