Energy loss measurements for 20 keV positrons in Al thin...

Applied Surface Science 1995 Vol. 85; Iss. none

Energy loss measurements for 20 keV positrons in Al thin films

G.R. Massoumi, W.N. Lennard, Peter J. Schultz, T.A. Porcelli, P.J. Simpson
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Volume:
85
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0169-4332(94)00305-x
File:
PDF, 280 KB
english, 1995
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