APFIM investigations on ordered γ-TiAl using single-layer detection method
J. Wesemann, G. Frommeyer, M. KreussVolume:
87-88
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/0169-4332(94)00483-8
File:
PDF, 692 KB
english, 1995