Development of a FEM, FIM-AP system for studying gridded vacuum microelectronic devices
M. Huang, R.A.D. Mackenzie, G.D.W. Smith, N.A. CadeVolume:
87-88
Year:
1995
Language:
english
Pages:
7
DOI:
10.1016/0169-4332(94)00484-6
File:
PDF, 734 KB
english, 1995