XPS studies on SiC thin layers formed by ion implantation...

XPS studies on SiC thin layers formed by ion implantation with a metal vapor vacuum arc ion source

H. Yan, R.W.M. Kwok, S.P. Wong
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Volume:
92
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/0169-4332(95)00203-0
File:
PDF, 332 KB
english, 1996
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