The properties of SiO2 films using direct photo-chemical...

The properties of SiO2 films using direct photo-chemical vapor deposition on strained SiGe layers

C.T. Lin, S.J. Chang, D.K. Nayak, Y. Shiraki
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Volume:
92
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/0169-4332(95)00228-6
File:
PDF, 312 KB
english, 1996
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