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Porous silicon studied by SiL23 soft X-ray emission
R.S. Crisp, D. Haneman, R. Sabet-DarianiVolume:
92
Year:
1996
Language:
english
Pages:
6
DOI:
10.1016/0169-4332(95)00229-4
File:
PDF, 363 KB
english, 1996