Characterization of ultrasharp field emitters by projection microscopy
M.J. Fransen, E.P.N. Damen, C. Schiller, T.L. van Rooy, H.B. Groen, P. KruitVolume:
94-95
Year:
1996
Language:
english
Pages:
6
DOI:
10.1016/0169-4332(95)00358-4
File:
PDF, 448 KB
english, 1996