Characterization of sputter-deposited multilayers of Ni and...

Applied Surface Science 1996 Vol. 94-95; Iss. none

Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP

T. Al-Kassab, M.-P. Macht, V. Naundorf, H. Wollenberger, S. Chambreland, F. Danoix, D. Blavette
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
94-95
Year:
1996
Language:
english
Pages:
7
DOI:
10.1016/0169-4332(95)00391-6
File:
PDF, 436 KB
english, 1996
Conversion to is in progress
Conversion to is failed