Oxide thickness dependence of photocurrent for...

Applied Surface Science 1996 Vol. 100-101; Iss. none

Oxide thickness dependence of photocurrent for theGeO2/Gefilm system

Yasumitsu Matsuo, Kazuo Oishi
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Volume:
100-101
Year:
1996
Language:
english
Pages:
4
DOI:
10.1016/0169-4332(96)00297-8
File:
PDF, 331 KB
english, 1996
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