Characterization of triazine derivatives on silicon wafers...

Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)

S. Dieckhoff, V. Schlett, W. Possart, O.-D. Hennemann, J. Günster, V. Kempter
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Volume:
103
Year:
1996
Language:
english
Pages:
9
DOI:
10.1016/0169-4332(96)00567-3
File:
PDF, 761 KB
english, 1996
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