Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)
S. Dieckhoff, V. Schlett, W. Possart, O.-D. Hennemann, J. Günster, V. KempterVolume:
103
Year:
1996
Language:
english
Pages:
9
DOI:
10.1016/0169-4332(96)00567-3
File:
PDF, 761 KB
english, 1996