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Eigenstructure tracking analysis for revealing noise pattern and local rank in instrumental profiles: application to transmittance and absorbance IR spectroscopy
Jostein Toft, Olav M. KvalheimVolume:
19
Year:
1993
Language:
english
Pages:
9
DOI:
10.1016/0169-7439(93)80083-t
File:
PDF, 918 KB
english, 1993