X-ray photoelectron spectroscopy study of the growth of...

X-ray photoelectron spectroscopy study of the growth of dielectric films on various substrates

Y. Wang, S. Fisson, V. Nguyen Van, G. Vuye, K. Yu-Zhang, J. Rivory
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Volume:
68-69
Year:
1994
Language:
english
Pages:
5
DOI:
10.1016/0257-8972(94)90245-3
File:
PDF, 611 KB
english, 1994
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