Effects of contact resistance on the evaluation of charge carrier mobilities and transport parameters in amorphous zinc tin oxide thin-film transistors
Schulz, Leander, Yun, Eui-Jung, Dodabalapur, AnanthVolume:
115
Language:
english
Journal:
Applied Physics A
DOI:
10.1007/s00339-014-8422-3
Date:
June, 2014
File:
PDF, 600 KB
english, 2014