Quantitative trait locus mapping for Verticillium wilt resistance in a backcross inbred line population of cotton (Gossypium hirsutum
Fang, Hui, Zhou, Huiping, Sanogo, Soum, Flynn, Robert, Percy, Richard G., Hughs, Sidney E., Ulloa, Mauricio, Jones, Don C., Zhang, JinfaVolume:
194
Language:
english
Journal:
Euphytica
DOI:
10.1007/s10681-013-0965-4
Date:
November, 2013
File:
PDF, 350 KB
english, 2013