Physical model of dynamic Joule heating effect for reset process in conductive-bridge random access memory
Sun, Pengxiao, Li, Ling, Lu, Nianduan, Li, Yingtao, Wang, Ming, Xie, Hongwei, Liu, Su, Liu, MingVolume:
13
Language:
english
Journal:
Journal of Computational Electronics
DOI:
10.1007/s10825-013-0552-x
Date:
June, 2014
File:
PDF, 755 KB
english, 2014