Increasing the Fault Coverage of Processor Devices during...

Journal of Electronic Testing 2014 / 06 Vol. 30; Iss. 3

Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test

de Carvalho, M., Bernardi, P., Sanchez, E., Reorda, M. Sonza, Ballan, O.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
30
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-014-5457-5
Date:
June, 2014
File:
PDF, 789 KB
english, 2014
Conversion to is in progress
Conversion to is failed