Risk evaluation in failure mode and effects analysis using fuzzy digraph and matrix approach
Liu, Hu-Chen, Chen, Yi-Zeng, You, Jian-Xin, Li, HuiVolume:
27
Language:
english
Journal:
Journal of Intelligent Manufacturing
DOI:
10.1007/s10845-014-0915-6
Date:
August, 2016
File:
PDF, 609 KB
english, 2016