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Domain structure and leakage mechanism of BiFeO3thin films deposited at different temperatures
Li, Huiqin, Liu, Jingsong, Liao, Qilong, Zhang, Wanli, Zhang, ShurenVolume:
25
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-014-1973-4
Date:
July, 2014
File:
PDF, 839 KB
english, 2014